Aec q100 001 pdf file

Openclose control for engine throttle and other valves. Supplier claims aec certified based on self certification using aec q101 test results. The initial release of aec q100 was presented to ic suppliers in june, 1994. Submission of the required data in the format shown below is. Following this initial start, qualification specifications for other part categories were developed. Aec q101001 reva july 18, 2005 component technical committee automotive electronics council page 1 of 11 method 001 discrete component human body model hbm electrostatic discharge esd test 1. Specifications are subject to change without notice. Ixdn609si vis foundry process cu05ums12010 qualification no. Isots16949 is an international standards automotive quality systems technical specification. Attachment 1 aec q101001 reva human body model hbm. Aec q100 revg m ay 14, 2007 failure m echanism based stress test qualification for integrated circuits com ponent technical com m ittee a utom otive electronics c ouncil aec q100 revg m ay 14, 2007 com ponent technical com m ittee a utom otive electronics c ouncil table of contents aec q 100 failure m echanism based stress test qualification for integrated circuits appendix 1.

Aec q100 001 revc october 8, 1998 component technical committee automotive electronics council page 3 of 11 1. Absolute maximum ratings exceeding the absolute maximum ratings may cause permanent damage. Exposure to absolute maximumrated conditions for extended periods may affect device reliability. The fm25v10g represents the largest, 1mb fram memory array size in. Q100 certification of design, construction and qualification supplier name. The following information is required to identify a device that has met the requirements of aec q100. Issue number 001 july 2015 new product announcement ah3762q ah3769q new family aecq100 the diodes advantage. May be certified to iso 16949 quality management systems particular requirements for the application of iso 9001. Aec q100 001 aec q003 v v c2 wire bond pull thb or hast milstd883 m2011 aec q003 v v c3 solderability sd jesd22b102 or jstd002d v dip and look smd reflow c4 physical dimensions pd jesd22b100 and b108 aec q003 v c5 solder ball shear sbs aec q100 010 aec q003 v v c6 lead integrity li jesd22b105 v failure mechanism. Aec q08 3 800 early life failure rate, 125c 125c 48 hrs 324000 edr b3 aec q05 3 77 nvm endurance, data retention, and operational life na na test group c package assembly integrity tests wbs c1 aec q01 1 30 wire bond shear cpk1. Precision automotive thin film chip resistors, aecq200. Aec q100 revh september 11, 2014 component technical committee automotive electronics council appendix 2. Although the specific device of interest has not finished aecq100 rev g reliability testing, it is.

If you intend to make local changes to the template, make a copy of these items and modify the copy. Lm3409, q1, lm3409hv, q1 pfet buck controller for high. This family of ics has passed an automotive qualification. Automotive electronics councilq200 stress test qualification. New aecq101qualified standard, schottky, and fred pt. Aec q100 any integrated circuit needs to be tested for compliance with aec q100 before it can be marketed as an automotivegrade device. Annex to declaration of accreditation scope of accreditation.

G has been successfully completed on the specific device of interest. Highprecision linear halleffectbased current sensor ic. This qualification report includes family data for the. Mxp7205vw pwm generator spi interface ma01810 memsic accelerometer 0g shock aec q100 002 smd 17mg ti28 sensor cmos 14bits text. Automotive product aecq 100g qualification test plan. Automotive product aecq100g qualification test plan. Esdajedec joint technical report user guide of ansiesdajedec js 001 human body model testing of integrated circuits 1. The ss1f4hm3, ss1fh6hm3, and ss2fh6hm3 schottky rectifiers are characterized by low forward drops down to 0. Aec certified products component supplier successfully completes qualification test requirements of aec q100, 101, 200 etc.

Services available from phasix esd including esd testing for human body model hbm, machine model mm and charged device model cdm according to all published standards including milstd 883g method 3015. The aec component technical committee is the standardization body for establishing standards for reliable, high quality electronic. Aec q101001 electrostatic discharge test human body model. Msop10ep aec q100 ts19503cb10h 60v dcdc singlechannel buck led controller with analog and pwm dimming aec q100 msop10ep ts19820cs q1m noniso pwmlinear dim led driver with 3. Lot q20030060aabshra device nc7sv125p5x industry standard aec q100 001 test conditions read points q20030060abbshra nc7sv125p5x aec q100 001 test. It is strongly recommended that the final test limits be established using aecq001 guidelines for part. Automotive product aecq100g qualification test result.

This includes both device and package tests as required by the aec q100 rev g specification. The ah376xq series provides a reliable high voltage, high performance hall effect latch for automotive applications. Electrostatic discharge r aecq200002 at 2 kv, human body 0. These calculations only consider elfr and dlt data from this qualification. Aec q100 011 250v500v 750v corner pins p electrostatic discharge human body model esdhbm aec q100 002 500vv2000v p electrical distribution aec q100 009 p wire ball shear aec q100 001 p final visual jesd22b101b p physical dimensions jesd22b100 and b108 p. The automotive electronics council aec is an organization originally established in the 1990s by chrysler, ford, and gm for the purpose of establishing common partqualification and qualitysystem standards. Highperformance glonassbdgps solution module model no skg12q revision. The output current can be adjusted by applying a dc voltage or a pwm waveform. Description the mlx91208 is a monolithic sensor ic featuring the. Application examples inverter hev and ev bldc motor current monitoring smart fuse overcurrent detection acdc converters dcac converter inverter dcdc switched mode power supply acd figure 1. Neolea m8t data sheet ubx15025193 r03 page 2 of 35 document information title neolea m8t subtitle ublox m8 concurrent gnss timing modules document type data sheet document number ubx15025193 revision and date r03 21jun2016 document status production information document status explanation.

Automotive grade auips2041rl infineon technologies. Lm2904q1, lm2904bq1 industrystandard dual operational. Approval is defined as user approval for use of the component within the customers application and, as such, is beyond the scope of aecq200. Automotive new product qualification summary as per aecq100. This includes both device and package tests as required by the aecq100 rev g specification. Q100 rev f edits accepted 7703 pdf automotive electronics. Mxp7205vw pwm generator spi interface ma01810 memsic accelerometer 0g shock aecq100. Q101 certification of design, construction and qualification.

We at oki engineering conduct all aec compliant reliability tests for automotive ics. Aec q100 covers active components silicon diode, processors, phys, leds aec q200 covers passive components inductors, resistors, capacitor, etc. Human body model hbm electrostatic discharge test aec q100 004 revd. Per aec q100 001 30 bonds minimum 5 units1 lot all measurement within spec limits. Pdf attiny87attiny167 attiny87 attiny167 7792b attiny87 aec q100 attiny167 attiny attiny16. Use the parts which have gone through preconditioning. Automotive brushed dc motor driver ics toshiba electronic. Therefore, it can be qualified within the scope of aecq100 per section 2. Aec q100 001 revc october 8, 1998 component technical committee automotive electronics council page 2 of 11 1. Pcn apgpts148446 dated 07 may 2014 mouser electronics. If us value is high, then it may not pass the 5b test. Performance is based on current flowing through the primary leadframe and includes the power consumed by the pcb.

Lot q20030060aabshra device nc7sv125p5x industry standard aecq01 test conditions read points q20030060abbshra nc7sv125p5x aecq01 test. Aec q101 001 reva july 18, 2005 component technical committee automotive electronics council page 1 of 11 method 001 discrete component human body model hbm electrostatic discharge esd test 1. Subsequent qualification plans will automatically use updated revisions of these referenced documents. Aec q100 is a technical standard for various reliability tests for integrated circuits ic developed for automotive applications. The following documents have been established by the aec component. Each type of component has a specific table of requirements which have to be meet in. Reliability testing that complies with the automotive industrys aec q100 rev. The aec q100 is defined by the automotive electronics council as a stress test for qualification for integrated circuits. Automotive aecq100 grade 2 compliance reliability qualification report for as4c4m16sa6tan6ban 4m x 16 sdr sdram with pbhalogen free 0.

User guide of ansiesdajedec js001 human body model. Change implementation schedule forecasted implementation date for 30jun2014. Failure mechanism based stress test qualification for integrated circuits. Nonvolatile memory programerase endurance, data retention, and operational life test aec q100 012 rev. Aec q100 tests all tests are compliant with automotive electronics council aec q100 regulations. Automotive aecq100 grade 2 compliance alliance memory. Qualification is defined as successful completion of the test requirements defined in aecq200. Aec documents are designed to serve the automotive electronics industry. Buckboost a buckboost regulator is like a buck and boost combined. Ixdn604si vis foundry process cu05ums12010 qualification no. The purpose of this specification is to establish a reliable and repeatable procedure for. Irs industrial and consumer qualification level is granted by extension of the higher automotive level. Com page 5 of 6 fit failure in time rate on the aec q100 rev g automotive.

Cd4051bcn cd4051bcn industry standard aec q100 001 test. Wherever possible, it references applicable jedec such as jesd47 or other widely accepted standards for requirements. The aec q100 standard also includes customer specific requirements csr. Moisture sensitivity level dpak3l msl1, 260c per ipcjedec jstd020 sot2233l msl2, 260c per ipcjedec jstd020 8lsoicn msl2, 260c. It does not give pass or fail values or recommend specific test equipment, test structures or test algorithms. This document describes backendlevel test and data methods for the qualification of semiconductor technologies.